Transmission electron microscopy (TEM)

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Transmission electron microscopy (TEM) is a microscopy technique whereby a beam of electrons is transmitted through an ultra thin specimen, interacting with the specimen as it passes through. An image is formed from the interaction of the electrons transmitted through the specimen; the image is magnified and focused onto an imaging device [1].

A light microscope is limited by the wavelength of light. TEMs use electrons as "light source" and their much lower de Brogli wavelength makes it possible to get a resolution a thousand times better than with a light microscope. TEMs can image objects to the order of a few angstrom [2].

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Fig. 1 (a) and (b) show TEM images of 10 nm Au-bound M13 viruses of different nanoarchitectures.




[3] F. Huang, K. Addas, A. Ward, N. T. Flynn, E. Velasco, M. F. Hagan, Z. Dogic, and S. Fraden, PRL 102, 108302 (2009)