Difference between revisions of "Evidence for capillarity contributions to gecko adhesion from single spatula nanomechanical measurements"

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(Summary)
(Summary)
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==Reference==
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Huber, G., Mantz, H., Spolenak, R., Mecke, K., Jacobs, K., Gorb, S., Arzt, E., Proc. Natl Acad. Sci. USA 102, 16293–16296 (2005).
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==Keywords==
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capillarity, adhesion, monolayer, spatula, contact angle
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==Reference==
 
==Reference==
 
Huber, G., Mantz, H., Spolenak, R., Mecke, K., Jacobs, K., Gorb, S., Arzt, E., Proc. Natl Acad. Sci. USA 102, 16293–16296 (2005).
 
Huber, G., Mantz, H., Spolenak, R., Mecke, K., Jacobs, K., Gorb, S., Arzt, E., Proc. Natl Acad. Sci. USA 102, 16293–16296 (2005).

Revision as of 19:05, 7 October 2009

Reference

Huber, G., Mantz, H., Spolenak, R., Mecke, K., Jacobs, K., Gorb, S., Arzt, E., Proc. Natl Acad. Sci. USA 102, 16293–16296 (2005).

Keywords

capillarity, adhesion, monolayer, spatula, contact angle

Reference

Huber, G., Mantz, H., Spolenak, R., Mecke, K., Jacobs, K., Gorb, S., Arzt, E., Proc. Natl Acad. Sci. USA 102, 16293–16296 (2005).

Keywords

capillarity, adhesion, monolayer, spatula, contact angle

Summary

Figure 1

This paper shows that humidity affects gecko adhesion on the spatular level, i.e., the smallest level of the hierarchial gecko foot structure. This finding disagrees with previous studies which rejected the contribution of capillarity and which suggested that van der Waals forces dominate the high adhesion.

Because of the small size of the spatulae (<math>\approx</math> 200 nm wide and long), atomic force microscopy (AFM) was used to determine the pull-off force of a single spatula. Two types of Si wafers were used as surfaces: type N, with a thin Si oxide layer; and type T, with an Si oxide layer <math>\approx</math> 100 times thicker.